If yield rates aren’t a good metric, what does he think is then? It’s certainly not layoff numbers, or C-suite compensation.
If after all that investment you’re only able to produce TEN PERCENT of the product successfully, that’s a failure, by definition. Even if they quintuple the yields, that’s still incredibly poor
Gelsinger was hired as a known long time engineer, rather than as a business expert. I would trust his numbers from an engineering perspective, even though I was laid off under his rule
All depends on the maturity of the process. 10% for a new design on a bleeding edge process is possibly viable. You’ll then tweak the design and process to get the yield up.
If you have a chip that is 50% of the wafer area, a single fault will lead to a yield of 50%. Now compare it with a chip that is 1% of the wafer area, the same single fault gets a yield of 99%.
So comparing the yields of two processes without factoring in the die area is not a fair game.
If yield rates aren’t a good metric, what does he think is then? It’s certainly not layoff numbers, or C-suite compensation.
If after all that investment you’re only able to produce TEN PERCENT of the product successfully, that’s a failure, by definition. Even if they quintuple the yields, that’s still incredibly poor
Gelsinger was hired as a known long time engineer, rather than as a business expert. I would trust his numbers from an engineering perspective, even though I was laid off under his rule
All depends on the maturity of the process. 10% for a new design on a bleeding edge process is possibly viable. You’ll then tweak the design and process to get the yield up.
Only exception would be if they can produce those wafers at 1/10th of the previous cost, but I highly doubt that’s the case.
If it’s 1/10 of the cost of purchasing them from TSMC, it’s viable
Yield over die area should be the metric.
If you have a chip that is 50% of the wafer area, a single fault will lead to a yield of 50%. Now compare it with a chip that is 1% of the wafer area, the same single fault gets a yield of 99%.
So comparing the yields of two processes without factoring in the die area is not a fair game.